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Publications information icon

Synchrotron x-ray topography of electronic materials

Peer-reviewed
Tuomi, Turkka
Journal of Synchrotron Radiation2002Publications information icon

CCD camera for direct X-ray topography imaging

Peer-reviewed
Simomaa, K.; Tuomi, T.; Partanen, J.
University of Siegen1992Publications information icon

Synchrotron X-ray topography of undoped VCz GaAs crystals

Peer-reviewed
Tuomi, T.; Knuuttila, L.; Riikonen, J.; McNally, P.J.; Chen, Weimin; Kanatharana, J.; Neubert, M.; R...
Journal of Crystal Growth2002Publications information icon

Examination of laser micromachined InP using synhrotron x-ray topography

McNally, P.J; Lu, X.; Danilewski, A.N; Tuomi, T.; Lankinen, A.; Riikonen, J.
-2005Publications information icon

Synchrotron x-ray topography of cuprite using conventional thin sections

Danilewsky, A.N.; Schropp, B.; Kek, S.; Tuomi, T.; Taskinen, M.; Rantamäki, R.; McNally, P.J.; Curle...
-1997Publications information icon

Synchrotron x-ray topography of III-V semiconductors

Peer-reviewed
Tuomi, T.
-2000Publications information icon

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Peer-reviewed
Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, Turkka; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.;...
-2002Publications information icon

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Peer-reviewed
Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...
Materials Research Society Symposia Proceedings2002Publications information icon

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Chen, W.M.; McNally, P.J.; Jacobs, K.; Tuomi, T.; Danilewsky, A.N.; Lowney, D.; Kanatharana, J.; Knu...
-2002Publications information icon

Geometric determination of direction of dislocations using synchrotron X-ray transmission topography

Peer-reviewed
DOI
10.1107/S1600577520011248
Tuomi, T. O.; Lankinen, A.; Anttila, O.
Journal of Synchrotron Radiation2020

Synchrotron x-ray topography of electronic materials

Peer-reviewed
2002

CCD camera for direct X-ray topography imaging

Peer-reviewed
1992

Synchrotron X-ray topography of undoped VCz GaAs crystals

Peer-reviewed
2002

Examination of laser micromachined InP using synhrotron x-ray topography

2005

Synchrotron x-ray topography of cuprite using conventional thin sections

1997

Synchrotron x-ray topography of III-V semiconductors

Peer-reviewed
2000

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Peer-reviewed
2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

Peer-reviewed
2002

White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

2002

Geometric determination of direction of dislocations using synchrotron X-ray transmission topography

Peer-reviewed
DOI
10.1107/S1600577520011248
2020